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182X-1820X Electronic Measuring Metallographic Microscope 12 Million Pixels USB2.0 Camera

Model: SWG-BH1200U
Description
Model
SWG-BH1200U
Optical Magnification
50X,100X,200X,500X
Electronic Amplification
182X-1820X
Optical System
Finite Vision Optical System
Eyepiece
High Eye Point Large Field of View Flat Field Eyepiece PL10X18mm
Objective Lens
Long Working Distance Finite Flat Field Achromatic Metallographic Objective
LMPlan   5X/0.13 WD 15.5mm
LMPlan  10X/0.25 WD 8.7mm
LMPlan 20X/0.4 WD 8.8mm
LMPlan 50X/0.6 WD 5.1mm
Observation Tube
30° Tilt,Hinged Trinocular Viewing Tube,Pupillary Distance Adjustment Range 54-75mm,Diopter Adjustment ±5
Converter
Five Hole Converter
Focusing System
Coarse and Micro Coaxial Focusing Mechanism,Fine Adjustment Accuracy 0.002mm,With Locking and Limiting Device
Operating Platform
Double-layer Mechanical Moving Platform,(Attachment 102X102mm Flat Plate)
Right Hand Low Hand Control of X and Y Directions
Platform Area:140mmX132mm,Moving Range 76mmX50mm
Up and Down Lighting System
Built In 100-240V Wide Voltage System,Single High-Power 5W LED,Warm Color
Trinocular Interface
0.5X  C-Mount Interface,Adjustable Focus
Condenser
Abbe Condenser,Numerical Aperture N.A.1.25,With Aperture Diaphragm and Color Filter Bracket
Pixel
12 Million Pixels
Output Method
USB2.0
Sensor
12M/IMX577(C)
Sensor Size
1/2.3“ (5.95x4.71)
Resolution Frame Rate
20@3840x3040,20@1920x1520,20@960x760
Pixel Size
1.55 μmx1.55 μm
Exposure Time
0.1-2000 ms
Exposure
Auto/Manual
White Balance
Lock White Balance,Area White Balance,Gray Level
Image Adjustment
Hue,Saturation,Brightness,Contrast,Sharpness,Permeability,DPC
Capture
Click This Button to Capture The Image of The Preview Interface and Support Continuous Point Photography.
Operating System
Microsoft Windows/Vista/7/8/10(32 & 64 bit)OS X (Mac OS X), Linux
File Save
Can Set File Name,Save Pictures With Time Format,Save Path Selection
Camera Function
Advanced Software For Windows:
- Provide the SDK
- Provides Splicing,EDF,Video Recording and Measurement Functions;
- Perform Measurements of Length,Angle,Radian,Area,Etc;